Diagnosis of Single-Gate Failures in Combinational circuits
G.D. Hornbuckle, Richard N. Spann · IEEE Transactions on Computers · 1969
Two procedures are presented for detecting and diagnosing arbitrary single-gate failures in combinational logic circuits. A gate is defined as any multiple-input single-output combinational circuit, and a failure is any detectable transformation of the correct gate function. The testing procedures do not require the construction of a fault table and will locate, to within an equivalence class, the faulty gate and describe its failure.