Test vector chains for increased targeted and untargeted fault coverage
Irith Pomeranz, Sudhakar M. Reddy · 2008
We introduce the concept of test vector chains, which allows us to obtain new test vectors from existing ones through single-bit changes without any test generation effort. We demonstrate that a test set T 0 has a significant number of test vector chains that are effective in increasing the numbers of detections of target faults, i.e., faults targeted during the generation of T 0, as well as untargeted faults, i.e., faults that were not targeted during the generation of T 0.