Parallel automated test pattern generation on the Connection Machine
P. Mayor, Vijay Pitchumani, V. Narayanan · 2003
The authors present an SIMD (single-instruction multiple-data) algorithm for automated test pattern generation. An effort was made to parallelize the individual steps of FAN by employing the massive parallelism of the Connection Machine. The algorithm considers one fault at a time and generates a test for it. Fine-grain parallelism is achieved by several gates within a level simultaneously doing multiple backtrace or forward simulation.>