Sequential redundancy removal using test generation and multiple unreachable states
Hiroyuki Yotsuyanagi, So Hata, Masaki Hashizume, T. Tamesada · 2002
In this paper, a procedure to reduce sequential circuits by removing undetectable faults in sequential circuits is proposed. To identify whether an undetectable fault is removable or not, strongly unreachable states, which are the states with no incoming transitions, are utilized. It is proved that part of undetectable faults related to strongly unreachable states can be removed from a circuit. Test generation method is used to find undetectable faults related to two or more strongly, unreachable states. Experimental results for ISCAS benchmark circuits are shown.