On the Probabilistic Characterization of Nano-Based Circuits
Xiaojun Lu, Jianping Li, Wenyin Zhang · IEEE Transactions on Nanotechnology · 2008
The paper presents a novel probabilistic logical model to describe the nanodevice states. It describes the probability distribution of outputs. The model is based on observations on statistical physics and Markov random field. Different from previous model [Bahar (2004),Nano,QuantumandMolecularComputing:ImplicationstoHighLevelDesignandValidation, S. Shukla and R. I. Bahar, Eds. Norwell, MA: Kluwer], it uses probability density function to describe the probability behavior of the nanoscale circuits, which is more reasonable and flexible.