Test Generation in Systolic Architecture for Multiplication Over $GF(2 ^{m})$
Hafizur Rahaman, Jimson Mathew, Dhiraj K. Pradhan · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2009
This paper presents a test generation technique for detecting stuck-at(SAF)and transition delay fault(TDF)at gate level in the finite-field systolic multiplier over GF(2m) based on polynomial basis. The proposed technique derives test vectors from the cell expressions of systolic multipliers without any requirement of Automatic test Pattern Generation (ATPG) tool. The complete systolic architecture is C-testable for SAF andTDFwith only six constant tests. The test vectors are independent of the multiplier size. The test set provides 100% single SAF and TDF coverage.