Eliminating data invalidation in debugging multiple-clock chips
Jianliang Gao, Yinhe Han, Xiaowei Li · 2011
A critical concern for post-silicon debug is the need to control the chip at clock cycle level. In a single clock chip, run-stop control can be implemented by gating the clock signal using a stop signal. However, data invalidation might occur when it comes to multiple-clock chips. In this paper, we analyze the possible data invalidation, including data repetition and data loss, when stopping and resuming a multiple-clock chip. Furthermore, we propose an efficient solution to eliminate data repetition and data loss. Theoretical analysis and simulation experiments are both conducted for the proposed solution. We implement the proposed Design-for-Debug (DfD) circuit with SMIC 0.18μm technology and simulate the data transfer across clock domains using SPICE tool. The results show that both data repetition and data loss can be avoided with the proposed solution, even if metastability occurs.