Switch-level modeling of transistor-level stuck-at faults
Peter Lidén, Peter Dahlgren · 2002
Two new switch-level algorithms with efficient management of unknown values are evaluated with respect to their fault modeling capability. The degradation of confidence in fault detection measures owing to unknown (X) output values is discussed and a strategy to quantify this uncertainty is proposed. It is demonstrated that this uncertainty can be decreased significantly when the node model is extended to include two resistances.