Parameter design solutions for analog in-circuit testing problems
Bart Anderson · 2003
An approach is described for developing optimum test settings for computer-controlled printed-circuit testing equipment. In-circuit automatic test equipment individually tests each component on a printed-circuit assembly by isolating the device being tested. Diagnostic messages provided by the system are specific to the defective component. The empirical approach described was developed by G. Taguchi (1987) and is known as parameter design. An overview is presented of basic, analog in-circuit testing theory. The steps followed by a test engineer as he applies parameter design to solve a difficult testing problem are also described.>