Fault characterization of standard cell libraries using inductive contamination analysis (ICA)
Jitendra B. Khare, Wojciech P. Maly, N. Tiday · 2002
In this paper we demonstrate an Inductive Contamination Analysis (ICA)-based methodology for complete fault characterization of standard cell libraries. Such a characterization has applications in accurate assessment of defect coverage, contamination diagnosis, gate-level delay characterization and test generation.