Reduced Hamming count and its aliasing probability
Anita Gleason, Wen B. Jone · 2002
Hardware overhead reduction through counter selection is considered for the Hamming count compaction test. A method to choose the most effective syndrome and input variable counter pair is given. Both simulation and theoretical analysis illustrate that this method produces an optimal pairing. The aliasing probability of this two-counter test is developed and shown to reduce the exhaustive ones count aliasing probability by half an order.>