Smart-substrate multichip-module systems
Wojciech P. Maly, D.B.I. Feltham, Anne Gattiker, M.D. Hobaugh, K. Backus, Michael E. Thomas · IEEE Design & Test of Computers · 1994
This implementation strategy enables incremental test of all system components, providing an alternative solution to the known good die testing problem. The authors present a simple microcontroller emulator designed and fabricated for study of the test logic needed as a key component of this method.>