Phase Delay Measurement and Calibration in Built-In Analog Functional Testing
Jie Qin, Charles E. Stroud, Foster Fa Dai · Proceedings · 2007
A built-in self-test (BIST) approach has been proposed for functionality measurements of analog circuitry in mixed-signal systems. The BIST circuitry consists of a direct digital synthesizer (DDS) based test pattern generator (TPG) and multiplier/accumulator (MAC) based output response analyzer (ORA). In this paper we investigate and discuss the effects of phase delay on analog functionality measurements in mixed-signal systems when using MAC-based ORAs. We show that phase delay has a critical impact on measurement results and that the MAC-based ORA is an effective method for measuring phase delay.