Efficient Interconnect Test Patterns for Crosstalk and Static Faults
Piljae Min, He Yi, Jae‐Hoon Song, Sanghyeon Baeg, Sang‐hyo Park · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2006
This paper introduces effective test patterns for system-on-chip and board interconnects. Initially, “$6n$” patterns are introduced to completely detect and diagnose both static and crosstalk faults, where “$n$” is the total number of interconnect nets. Then, more economic “$4n + 1$” patterns are described to test the crosstalk faults for the interconnect nets separated within a certain distance.