A Cost-effective Test Data Compaction Scheme
Eleanor Wu, M.R. Moskowitz · 1992
The most effective way to extract the golns go information from the massive amount of test data we face today is through test data compaction. Signature analysis, specifically Multiple Input Shift Register (MISR), is the test data compaction technique that has attracted most of the attention [Pra90, Wi1891. In evaluating the effectiveness of MISRs, most of the research effort has been spent in calculating the probability of the error escape due to its compaction. However, from our experience in using MISRs on four different chips, we have found that implementing MISRs in a cost effective way is another problem demanding further research. In this paper we present a real-time test data compaction scheme using MISRs. We show that this new scheme can realize a 65% cost saving in hardware implementation with an additional error escape probability of 1 - 2%.