A strategy for board level in-system programmable built-in assisted test and built-in self test
Joshua Ferry, J. Scesnak, S.A. Shaikh · 2006
In-system programmable (ISP) built-in self test (BIST) and built-in assisted test (BIAT) is a board test strategy that utilizes field programmable gate arrays (FPGAs), reconfigured solely for the application of test vectors. These test vectors are designed to either assure manufacturing & operational quality or assist in the functional verification. While mitigating lack of test access is the most prevalent application, increased device test capability as well as lower development times is realized in board test and system test.