Can a User Test LSI Microprocessors Effectively?
W. Luciw · IEEE Transactions on Manufacturing Technology · 1976
This paper elucidates user oriented test philosophy for LSI microprocessors. Also, a low-cost incoming inspection tester is described. The significant difference between this and available testers is the use of probabilistic scheme by which the instruction, data, and control signal mixes are generated. This approach reduced significantly tester hardware and supporting software without compromise of overall test performance.