Improvement of the accuracy of the logometric impedance meters in wide frequency range
M. N. Surdu, A. L. Lameko, Alexey Panich · 16th International Congress of Metrology · 2013
Logometric impedance meter with variational correction of the uncertainty, caused by finite loop amplification and admittance between protecting amplifier inputs has been developed. To correct named uncertainty, the variation of the protecting amplifier gain is provided and additional measurement of the voltage drop on the standard is implemented. Appropriate calculation eliminates influence of the described uncertainty source on the result of measurement. Proposed approach has been used in the logometric impedance meter MNS1200, delivered to Siberian Institute of Metrology to be used in secondary standard of inductance for frequency up to 1 MHz.