Convolutional Compaction-Driven Diagnosis of Scan Failures
Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer, Chen Wang · 2005
This paper describes a fault diagnosis technique for scan-based designs with convolutional test response compaction. The proposed approach allows a time-efficient and accurate identification of failing scan cells using Gauss Jordan elimination method.