Designing UltraSparc for testability
M.E. Levitt · IEEE Design & Test of Computers · 1997
With a focus on a short time to volume production, the UltraSparc microprocessor design incorporated innovative features that optimize test, debug and manufacture. The following areas are discussed: goals; cost-benefit analysis; scan design; decoded multiplexer; test generation flow; custom circuit blocks; boundary cell design; embedded array testing; and clock control features.