An Efficient Algorithm for Finding a Universal Set of Testable Long Paths
Zijian He, Tao Lv, Huawei Li, Xiaowei Li · 2010
In this paper, we focus on generation of a universal path candidate set U that contains testable long paths for delay testing. Some strategies are presented to speed up the depth first search procedure of U generation, targeting the reduction of sensitization criteria checking times. Experimental results illustrate that our approach achieves an 8X speedup on average in comparison with the traditional depth first search approach.