Cyclic stress tests for full scan circuits
Vinay Dabholkar, Sourish Chakravarty, J. Najm, J. Patel · 1995
To ensure the production of reliable circuits and fully testable unpackaged dies for MCMs burn-in, both dynamic and monitored, remains a feasible option. During this burn-in process the circuit needs to be stressed for an extended period of time. This requires computation of cyclic input sequences to stress the circuit. A taxonomy of stress related problems for full scan circuits is presented. It is shown that there are efficient ways to compute the sequences for many variations of monitored burn-in problems. Preliminary experimental results on ISCAS89 benchmark circuits are presented.