MODIFIED TRANSITION MATRIX AND FAULT TESTING IN SEQUENTIAL LOGIC CIRCUITS UNDER RANDOM STIMULI WITH A SPECIFIED MEASURE OF CONFIDENCE
SUNIL RANJAN DAS, Wen B. Jone · Cybernetics & Systems · 1986
In this paper multiple fault detection in sequential circuits by random testing is discussed. The concept of modified transition diagram initially proposed by Sheng and Das in the context of sequential machine identification is used as the model, and based on this, the upper and lower bounds on the length of the random test-input pattern to detect all faults in sequential circuits with a specified confidence degree are derived, assuming mat the faults result in at least one error transition of the circuits. The modified transition matrix and its higher-order forms are utilized to find the number of required test-input patterns to attain a sufficiently good confidence degree.