Advanced Techniques for GA-based sequential ATPGs
F. Corno, P. Prinetto, M. Rebaudengo, M. Sonza, Roberto Nicola Mosca · 1996
Genetic Algorithms have been recently investigated as an efficient approach to test generation for syn-chronous sequential circuits. In this paper we propose a set of techniques which significantly improves the performance of the GA-based ATPG algorithm pro-posed in [PRSR94]: in particular, the new techniques enhance the capability of the algorithm in terms of test length minimization and fault excitation. We report some experimental results gathered with a prototypical tool and show that a well-tuned GA-based ATPG is generally superior to both symbolic and topological ones in terms of achieved Fault Coverage and required CPU time. 1.