Scan chain clustering for test power reduction
Melanie Elm, Hans-Joachim Wunderlich, Michael E. Imhof, Christian G. Zoellin, Jens Leenstra, Nicolas Maeding · 2008
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-flops into scan chains, which determines how many chains can be deactivated per pattern.