Analytical Model for Multi-site Efficiency with Parallel to Serial Test Times, Yield and Clustering
Naveen Velamati, Robert Daasch · 2009
In this paper an analytical extension to the ITRS multi-site efficiency model is proposed to obtain the distribution of multi-site efficiency. Multi-site testing is becoming one of the most popular ways for test time reduction, increasing the test throughput and reducing the overall test cost. In the model, the efficiency of multi-site testing is computed from process parameters (e.g. yield, yield clustering at wafer sort), test program parameters parallel and serial test times, and multi-site count. Multi-site trade-offs and benefits to average test time are evaluated by Monte-Carlo simulations.