SPADES-ACE: A simulator for path delay faults in sequential circuits with extensions to arbitrary clocking schemes
Irith Pomeranz, Sudhakar M. Reddy · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1994
Testing of synchronous sequential circuits for path delay faults requires two sequences: a test sequence, that specifies the input values, and a clocking scheme, that specifies at what time units a fast clock should be applied. In this work, a fault simulator for path delay faults in synchronous sequential circuits is described, that has the following novel features. (1) For a given test sequence, all clocking schemes that have a single fast clock are simulated in parallel. (2) During the simulation process, it is possible to determine a minimal set of clocking schemes to achieve the same fault coverage as in (1). (3) Alternatively, it is possible to simulate the test sequence under a given clocking scheme, containing multiple fast clocks at arbitrary time units. (4) A path representation scheme is used, that allows efficient access to path delay faults detected by previous tests. Experimental results are presented to demonstrate these features and their effectiveness.>