Idealized statistical models for low-cost linear circuit yield analysis
Ka-Ho Leung, Robert J Spence · IEEE Transactions on Circuits and Systems · 1977
For the prediction of manufacturing yield, a modeling technique based on the regionalization of a variable component space is combined with the computational technique of systematic exploration to provide, for linear circuits, a remarkably efficient prediction of the spread in circuit performance due to spread in a number of components. Illustrative examples enable the new approach to be compared with the Monte Carlo technique.