$2^{n}$ Pattern Run-Length for Test Data Compression
Lung‐Jen Lee, Wang‐Dauh Tseng, Rung‐Bin Lin, Cheng‐Ho Chang · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2012
This paper presents a new pattern run-length compression method whose decompressor is simple and easy to implement. It encodes 2|n| runs of compatible or inversely compatible patterns, either inside a single test data segment or across multiple test data segments. Experimental results show that it can achieve an average compression ratio of 67.64% and considerable test application time savings.