Off chip monitors and built in current sensors for analogue and mixed signal testing
Yvan Maidon, Yann Deval, Hans Manhaeve · 2002
The aim of this paper is to be part a general survey regarding test methods for analogue and mixed circuits, using a stimulus on the signal or power supply inputs. The data is extracted from the power supply current I/sub DD/. It is based on the fruitful measurement of the I/sub DDQ/, the DC power supply current, as well as the measurement of the I/sub DDT/, the transient power supply current. This paper presents the state of the art of the existing current monitors sorted according to their sensitive element.