Design for Testability Based on Single-Port-Change Delay Testing for Data Paths
Y. Yoshikaw, Satoshi Ohtake, Michiko Inoue, Hideo Fujiwara · 2005
This paper introduces a new concept of hierarchical testability called Single-Port-Change (SPC) two-pattern testability. We propose a non-scan design-for-testability (DFT) method which makes each path that needs to be tested in a data path SPC two-pattern testable. An SPC two-pattern test guarantees robust (resp. non-robust) test if the path is robust (resp. non-robust) testable. Since it is easy to find justification paths for SPC two-pattern tests at register-transfer level, the proposed DFT method can reduce hardware overhead compared to that of our previous DFT method for arbitrary two-pattern tests. Furthermore, we propose a method to reduce test generation effort by removing a subset of sequentially untestable paths from targets of test generation. Experimental results show that the proposed method can reduce hardware overhead without losing the quality of test.