Brief communication Shift register modification for multipurpose use in combinational circuit testing
N.K. Nanda, Afaq Ahmad, V. C. GAINDHAR · International Journal of Electronics · 1989
By modifying the shift registers of the commonly used built-in self-test (BIST) scheme, an effective multipurpose testing tool has been realized. The tool is capable of providing maximum enhancement in fault-cover, as well as significant improvement in error coverage.