Proof that Akers' algorithm for locally exhaustive testing gives minimum test sets of combinational circuits with up to four outputs
Hiroyuki Michinishi, Tokumi Yokohira, Tatsuki Okamoto · 2002
In this paper, we prove that Akers' test generation algorithm for the locally exhaustive testing gives a minimum test set (MLTS) for every combinational circuit (CUT) with up to four outputs. That is, we clarify that Akers' test pattern generator can generate an MLTS for such CUT.>