On the design for testability of sequential circuits
Xiao Sun, Fabrizio Lombardi · 2002
Presents a new approach for design-for-testability (DFT) of sequential circuits. The proposed approach is based on augmenting the system under test (SUT) with additional circuitry such that the combinational part of the SUT and the sequential part (i.e. the flip-flops) can be tested independently (disjoint testing).>