CMOS unclonable system for secure authentication based on device variability
Daniele Puntin, Stefano Stanzione, Giuseppe Iannaccone · 2008
An unclonable system for product authentication in anti-counterfeiting has been implemented in standard 90 nm CMOS technology. The circuit exploits the intrinsic variability of the electrical characteristics of minimum size MOSFETs, in order to generate a physical one-way function that univocally identifies each particular IC. Effects of temperature, voltage supply and process variations have been internally compensated to obtain a robust and reliable behavior. Experimental measurements show that the circuit exhibits 30 muW power consumption, a bit error rate in response to a challenge smaller than 0.4% at 125degC or with a 10% voltage supply variation. Accelerated aging tests provide an estimate of a lifetime much in excess of the ten-year requirement. The very low power consumption makes the circuit also feasible for integration in RFID transponders.