A compact built-in current sensor for I/sub DDQ/ testing
Yiorgos E. Tsiatouhas, Themistoklis Haniotakis, Dimitrios Nikolos · 2002
In this paper a simple to implement, compact, build-in current sensor for I/sub DDQ/ testing of CMOS VLSI circuits based on current mirroring techniques is proposed. This sensor can attain small detection times and can be used for both on-line and off-line I/sub DDQ/ testing.