An efficient test generation for multiple fault coverage of two-rail checkers
Joseph C. W. Pang, M.W.T. Wong, Y. S. Lee · International Journal of Electronics · 1997
The design and implementation of an efficient test generation method for multiple fault coverage of self-testing two-rail checkers are presented. This method involves two steps. In the first step, the minimum set of tests required to detect all multiple faults is determined by working backwards from output to input. In the second step, a novel analytic scheme is used to analyse the test set, to enable the user to simplify the implementation of the test generation procedure. The resultant test has a test length significantly shorter than those previously reported. The test generation method is also suitable for parity checkers.