Fault analysis of differential cascode voltage switch circuits
Dapeng Oliver Wu, J. Davis, Bruce Swanson · 2002
It is shown that the manufacturing process defects of DCVS (differential cascode voltage switch) circuits can be modeled as conventional stuck-at faults. A one-to-one correspondence relationship between each defect and each stuck-at fault is depicted using failure analysis. The results also show that a DCVS circuit can be fully tested using the fault model developed here.>