Augmenting board test coverage with new intel powered opens boundary scan instruction
Chwee Liong Tee, Tzyy Haw Tan, Chin Chuan Ng · 2009
Serious erosion of board test access demands a re-look on the current test strategy. This paper describes implementation of Extest Toggle* and its effectiveness. Note *: Extest Toggle is a design for test (DFT) method of providing a square wave at 1/2 TCK, while driving the remaining pins on the bus to a static level for guarding.