A Translinear RMS Detector for Embedded Test Of RF ICs
Q. Yin, William R. Eisenstadt, Robert M. Fox, Tao Zhang · IEEE Transactions on Instrumentation and Measurement · 2005
This paper presents a wide-bandwidth, high dynamic range, BiCMOS RF rms detector based on the dynamic translinear principle. A current-domain circuit carries out the main computation, and a circuit compensates for errors due to finite transistor gain. Wide-bandwidth input and output circuits allow connecting voltage-mode signals to the internal current-mode circuitry. Measurements on a prototype chip demonstrate that the circuit is suitable for embedded on-chip testing, particularly for "alternative test" of RF circuits.