SLOPE: a test pattern generator based on stop line oriented path end algorithm
S.-J. Chuang, C.-L. Lee, W.-Z. Shen, Chein-Wei Jen, J.-E. Chen, S.-C. Jing, M.-D. Chen · 2003
The authors present a test pattern generator, SLOPE, based on the stop line oriented path end algorithm, for combinational digital circuits. It combines the advantages of FAN and FAST by utilizing a controllability measure and observability measure to assist guessing in the test generation process. With some strategies adopted in the algorithm, it generates tests with fewer number of backtrackings. Benchmark circuits run with SLOPE show that it outperforms PODEM and FAN for most circuits.>