Classification of bridging faults in CMOS circuits: experimental results and implications for test
Scott F. Midkiff, S.W. Bollinger · 2002
Investigates linkages between physically realistic faults in CMOS integrated circuits and test generation and test quality. The procedure and results for an inductive fault analysis experiment that determined likely bridging faults in a set of CMOS circuits are presented. The implications of the results on test generation for physically realistic faults and on fault coverage are discussed.>