Automatic testability analysis of boards and MCMs at chip level
M. Perbost, Longying Lan, C. Landrault · 2002
Minimising the testing costs of boards and MCMs implies to invest in testability analysis in addition to the use of testing standards (IEEE 1149). In this paper, we propose a testability analysis method for boards and MCMs designed at Dassault Electronique. The actual prototype realised according to this new methodology aims at helping testability expert.