An Effective Test Pattern Generation for Testing Signal Integrity
Yongjoon Kim, Myung-Hoon Yang, Young‐Kyu Park, Daeyeal Lee, Sungho Kang · Asian Test Symposium · 2006
As more cores are integrated in a single chip with sophisticated process like nano technology, testing signal integrity between the cores needs much effort due to complicate coupling effects. In this paper, we propose a novel test pattern generation method for testing signal integrity. Using this method, short and effective test patterns are generated with low hardware overhead. It can be used for self-test scheme and experimental results show the effectiveness of the proposed scheme.