Histogram test of ADCs with chaotic samples
Tommaso Addabbo, Ada Fort, SANTINA ROCCHI, Valerio Vignoli · 2010
In this paper we discuss the possible use of chaotic signals for testing Analog to Digital Converters (ADCs). In detail, exploiting a chaos-based discrete-time noise generator, a method for generating test samples with a distribution arbitrarly close to the uniform one is proposed, and their use for the Code Density Test (also known as Histogram Test) of ADC is discussed.