Limitations in predicting defect level based on stuck-at fault coverage
Jihun Park, M. Naivar, R. Kapur, M. Ray Mercer, T.W. Williams · 2002
The stuck-at fault model has been used over decades as a guide to the test generation process and as an evaluation mechanism for the quality of the test set. As demands on quality have increased, the use of the stuck-at fault model as a predictor of the defect level has been questioned. This paper provides some insight on the issue and shows the limitations of using the stuck-at fault coverage to predict the defect level. The authors demonstrate that as defect level decreases the uncertainty of the estimate grows.>