Enhancing yield at the end of the technology roadmap
Naran Sirisantana, Bipul Chandra Paul, Kaushik Roy · IEEE Design & Test of Computers · 2004
Scaled manufacturing technologies require advanced techniques for improving device reliability and production yield. We present a transistor-level redundancy technique for manufacturing devices with low vulnerability and improving yield in future circuits The technique relies on appropriate design style selection and controlled redundancy to achieve area and power trade-offs.