Reliability of a QCA Array Multiplier
Ismo K. Hänninen, Jarmo Takala · 2008
Defects and faults of the future circuit technologies have to be taken into account early in the design of digital systems. To form practical design guidelines, we study the relationship between system reliability and component failure rates, in the case of a binary multiplier unit on quantum- dot cellular automata nanotechnology. The analysis is based on a decomposition of probabilistic transfer matrices, a versatile framework for computing the conditional probability of system failure. Our results indicate that passive wiring dominates the reliability of arithmetic designs on the nanotechnology.