Embedded test structures reduce ASIC time-to-market
D.M. Sobczak · 2002
LSI Logic Corporation, using embedded test circuitry developed by CrossCheck Technology Inc., has developed a new compacted array technology known as the LFT150K FasTest Array series. The author gives a brief overview of the LFT150K family, describe the performance impact of the embedded test structures, compare this test scheme with conventional scan methods, and describe the FasTest time-to-market and time-to-volume advantages.>