Analog Fault Diagnosis with Failure Bounds
Chiwan-Chia Wu, Kazuma Nakajima, Chin‐Long Wey, Richard E. Saeks · IEEE Transactions on Circuits and Systems · 1982
A simulation-after-test algorithm for the analog fault diagnosis problem is proposed in which a bound on the maximum number of simultaneous failures is used to minimize the number of test points required. The resultant algorithm is applicable to both linear and nonlinear systems with multiple hard or soft faults and can be used to isolate failures up to an arbitrarily specified "replaceable chip or subsystem."